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Low-temperature characteristics of In0.7Ga0.3As PHEMTs

机译:低温特性IN0.7GA0.3 .PHEMTS

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In this paper, we report on temperature dependent DC characteristics of In0.7Ga0.3As Pseudomorphic-HEMTs (PHEMTs) on InP substrate. First, we have fabricated the In0.7Ga0.3As PHEMTs with various values of Lg, ranging from 10 μm to 2.5 μm. The fabricated device with Lg = 2.5 μm exhibits excellent subthreshold-swing (SS) of 64 mV/decade at room temperature. Note that this is close to 60 mV/decade, which is a theoretical limit at room temperature in a FET configuration. Next, we have measured current-voltage characteristics at various values of temperatures, from 300 K to 80 K. Finally, we have investigated the temperature-dependent DC characteristics of the In0.7Ga0.3As PHEMTs, in terms of output, subthreshold, and transconductance characteristics.
机译:本文在INP衬底上报道了IN0.7GA0.3AS假瘤 - 骨折(PHEMT)的温度依赖性直流特性。首先,我们已经制造了具有各种LG值的IN0.7GA0.3AS PHEMT,范围为10μm至2.5μm。具有LG =2.5μm的制造装置在室温下表现出64 mV /十年的优异的亚阈值 - 摆动(SS)。请注意,这接近60 mV /十年,这是FET配置室温下的理论极限。接下来,我们在各种温度值下测量的电流 - 电压特性,从300k到80k。最后,我们研究了IN0.7GA0.3SPHEM的温度依赖性DC特性,以输出,亚阈值和跨导特性。

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