首页> 外文会议>Proceedings of the 2012 IEEE 18th International Mixed-Signals, Sensors and Systems Test Workshop >A Study on the Design of a Testable Fleischer-Laker Switched-Capacitor Biquad
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A Study on the Design of a Testable Fleischer-Laker Switched-Capacitor Biquad

机译:可测试的Fleischer-Laker开关电容双二阶设计的研究

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The Fleischer-Laker Switched-Capacitor (SC) biquad is a versatile building block for implementing analog filters. This paper studies how to design a testable Fleischer-Laker SC biquad based on the static linear behavior (SLB) analog fault model. In particular, we focus on how to achieve a 100% parametric fault coverage without sacrificing the design flexibility. We suggest not to use the capacitors L, K, and J in the most generalized Fleischer-Laker biquad so as to achieve a 100% parametric fault coverage defined by the SLB analog fault model.
机译:Fleischer-Laker开关电容(SC)双二阶是用于实现模拟滤波器的通用构建块。本文研究如何基于静态线性行为(SLB)模拟故障模型设计可测试的Fleischer-Laker SC双二阶。特别是,我们专注于如何在不牺牲设计灵活性的情况下实现100%参数化故障覆盖率。我们建议不要在最通用的Fleischer-Laker双二阶中使用电容器L,K和J,以实现SLB模拟故障模型定义的100%参数故障覆盖率。

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