Stress measurement by X-Ray diffraction method for electrodeposited SnCu coating on alloy 42 substrate

机译：X射线衍射法测量合金42基体上电沉积SnCu涂层的应力

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A stress measurement method using SnCu coating on an Alloy 42 substrate sample, which indicated non-linear sin Psi diagram for the coating under ordinary X-ray diffraction conditions was investigated. Diffraction profile versus 2thetas diagram

机译：研究了在合金42基体样品上使用SnCu涂层的应力测量方法，该方法表明了在普通X射线衍射条件下涂层的非线性sin Psi图。衍射曲线与2θ图

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来源
《Power Semiconductor Devices amp; IC's, 2005 IEEE International Symposium on; Lake Buena Vista,FL,USA》||P.1491-1497|共7页
会议地点 Lake Buena VistaFLUSA
作者
Kato; T.; Akahoshi; H.; Nakamura; M.; Hashimoto; T.; Nishimura; A.;
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原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
X-ray diffraction; copper alloys; electrodeposition; electrodeposits; internal stresses; phase diagrams; tin alloys; 2thetas diagrams; SnCu; X-ray diffraction; alloy substrate; electrodeposited coating; inclination method; nonlinear sinsup2/sup Psi diagram; stress;

机译：X射线衍射;铜合金;电沉积;电沉积;内应力;相图;锡合金;2θ图; SnCu; X射线衍射;合金基底;电沉积涂层;倾角法;非线性sin ^{2 PSI图;应力;}

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专利

1. X-ray diffraction grazing-incidence methods applied for gradient-free residual stress profile measurements in electrodeposited Ni coatings [J] . Kania Bogusz, Indyka Paulina, Tarkowski Leszek, Journal of Applied Crystallography . 2015,第1期

机译：X射线衍射掠入射法用于电沉积Ni涂层中无梯度残余应力分布的测量
2. X-ray diffraction measurement of residual stress in WC-Co thermally sprayed coatings onto metal substrates [J] . Oladijo O.P., Venter A.M., Cornish L.A., Surface & Coatings Technology . 2012,第23期

机译：WC-Co热喷涂涂层在金属基材上的残余应力的X射线衍射测量
3. Measurement of residual stresses by X-ray diffraction techniques in MoN and Mo2N coatings deposited by arc PVD on high-speed steel substrate [J] . Sarioglu C, Demirler U, Kazmanli MK, Surface & Coatings Technology . 2005,第2a3期

机译：通过X射线衍射技术测量电弧PVD在高速钢基材上沉积的MoN和Mo2N涂层中的残余应力
4. Stress measurement by X-Ray diffraction method for electrodeposited SnCu coating on alloy 42 substrate [C] . Kato T., Akahoshi H., Nakamura M., Electronic Components and Technology Conference . 2008

机译：用X射线衍射方法对合金42基板电沉积SnCU涂层的X射线衍射方法测量
5. X-RAY DIFFRACTION MEASUREMENT OF RESIDUAL STRESS (STRAIN): ENERGY DISPERSIVE X-RAY RESIDUAL STRESS MEASUREMENT. [D] . ROSEMEIER, RONALD GEORGE. 1981

机译：残余应力（应力）的X射线衍射测量：能量色散X射线残余应力测量。
6. A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth [O] . C. Li, S. D. M. Jacques, Y. Chen, -1

机译：同步加速器X射线衍射解卷积方法用于测量热障涂层中残余应力与深度的关系
7. A Synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth [O] . Jacques, Simon, Li, Chun, Chen, Ying, 2016

机译：用于测量热障涂层中残余应力作为深度函数的同步辐射X射线衍射反褶积方法

Stress measurement by X-Ray diffraction method for electrodeposited SnCu coating on alloy 42 substrate

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