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Terahertz Wave Generation and Detection Analysis of Nanowire Gated Field Effect Transistor

机译:纳米线门控场效应晶体管的太赫兹波产生与检测分析。

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摘要

A complete analysis of terahertz(THZ) wave generation and detection of silicon nanowire gated field effect transistor (SNFET) is presented in this paper. Based on the developed SNFET THZ device theory, the dependence of THZ detection of SNFET on bias and structure parameters are obtained and illustrated. The THZ generation condition and various unique characteristics are also demonstrated and analyzed in details. The numerical skills utilized in this paper are also described. Based on the developed numerical tool, the evolution processes of plasma wave in generation and detection mode are also presented.
机译:本文对太赫兹(THZ)波的产生和硅纳米线栅场效应晶体管(SNFET)的检测进行了完整的分析。基于发达的SNFET THZ器件理论,获得并说明了SNFET的THZ检测对偏置和结构参数的依赖性。还详细演示并分析了THZ生成条件和各种独特特性。本文还介绍了数字技巧。基于已开发的数值工具,给出了等离子体波在生成和检测模式下的演化过程。

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