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ANALYTICAL AND T-CAD MODELING OF PENTACENE THIN-FILM TRANSISTORS

机译:并五苯薄膜晶体管的分析和T-CAD建模

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Many researches report that the mobility in organic material is dependent on not only the gate field but also the grain size. There is also some evidence to prove that the gate length is strongly related to the carrier mobility. We construct both the analytical model of organic thin film transistor and the large signal circuit model designed by T-CAD to fit the measured I_(DS) —V_(DS) curves. We first apply basic I_(DS) — V_(DS) equations in both triode and saturation regions with mobility μ best fitted to measured Ⅰ-Ⅴ curves. The "best-fitted" μ increases with the gate length, and is related to the increase of total channel resistance due to the presence of small grains size of pentacene next to source/drain electrodes. We then use the Advanced Design System software to design the large signal circuit model. Similar to the MOSFET, we add the additional parameters to fit the I_(DS) — V_(DS) curves, ex: Rgd, Rgs, and Rp. Here, Rgd. With the circuit simulation, we find that Rgd presents the leakage current from gate to source, and it affects the slope of curves in the saturation region in the I_(DS) — V_(DS) curves. The equivalent circuit can fit the I_(DS) — V_(DS) curves very well with the proper parameter set.
机译:许多研究报告说,有机材料中的迁移率不仅取决于栅场,还取决于晶粒尺寸。还有一些证据证明栅极长度与载流子迁移率密切相关。我们构建了有机薄膜晶体管的分析模型和T-CAD设计的大信号电路模型,以拟合测得的I_(DS)-V_(DS)曲线。我们首先在三极管和饱和区都应用基本的I_(DS)— V_(DS)方程,其迁移率μ最适合于测得的Ⅰ-Ⅴ曲线。 “最合适”的μ随着栅极长度的增加而增加,并且与总沟道电阻的增加有关,这是由于在源极/漏极旁边存在并五苯的小晶粒尺寸。然后,我们使用Advanced Design System软件设计大型信号电路模型。与MOSFET相似,我们添加了其他参数以适合I_(DS)— V_(DS)曲线,例如:Rgd,Rgs和Rp。在这里,Rgd。通过电路仿真,我们发现Rgd表示从栅极到源极的泄漏电流,并且会影响I_(DS)-V_(DS)曲线的饱和区域中曲线的斜率。通过适当的参数设置,等效电路可以很好地拟合I_(DS)— V_(DS)曲线。

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