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Optical inspection of micro-electromechanical systems

机译:微机电系统的光学检查

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We report the results of utilization of wide-gap photorefractive sillenite crystals as adaptive photodetectors (AP) for optical inspection of micro-electromechanical systems. The operation principle of AP is based on two-wave mixing and non-steady-state photoelectromotive force effects in photorefractive crystals. The results of measurements of small vibration amplitudes and resonant frequencies of the diffusely scattering objects and micro-electromechanical systems are given. The presented adaptive interferometric systems are suitable for industrial applications.
机译:我们报告了利用宽间隙光折变亚硅酸盐晶体作为自适应光电探测器(AP)进行微机电系统光学检查的结果。 AP的工作原理是基于光折射晶体中的两波混合和非稳态光电动势效应。给出了散射体和微机电系统的小振幅和共振频率的测量结果。提出的自适应干涉测量系统适用于工业应用。

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