Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis

摘要

One of the visual problems hardest to recognize in liquid crystal displays (LCDs) is an area of non-uniform brightness called a mura. The accurate and consistent detection of a low-contrast mura is extremely difficult because the boundary between the regional mura and the background is indistinct. This paper presents a novel method for detection and quantitative measurement of low-contrast mura. Compared with some wavelet approaches, the multiple resolution analysis method based on the Symmetric Selesnick multiwavelet has advantages for practical use.