PROGRESS ON ELECTRON ENERGY LOSS SPECTROSCOPY OF NANOMATERIALS

摘要

Electron Energy Loss Spectroscopy in a Transmission Electron Microscope now has a very high energy resolution (0.1 eV) associated with a sub-nanometer probe. All elements of the periodic table can be detected, which makes it an essential technique for nanomaterial studies. After presenting the basis of the technique, a review of the most recent results is presented with a focus on: interfaces (Si-SiO_2 and derivatives), nano-objects (nanotubes, onions...), nanomaterials (composites, quantum wells...). Special consideration is given to the simulation of EELS spectra, showing the crucial explanatory aspect provided by theory. Finally, a more prospective part envisages possible near future developments in EELS which may help us solve forth-coming challenges in nanometer-scale analysis.