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Experimental Study of Heat Properties of Ba_1-xSr_xTiO_3 Thin Films on a Substrate

机译:衬底上Ba_1-xSr_xTiO_3薄膜热性能的实验研究

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摘要

The AC hot-strip method for the three layer system (conducting probe - dielectric thin film - dielectric bulk substrate) developed earlier is applied to determine the anomalies of specific heat C_p and the coefficient of heat conductivity #lambda# in the Ba_1-xSr_xTiO_3 system at the ferroelectric phase transition. The anomalies of C_p were observed and analysed for x=0.2;0.5;0.8 for the films with 1.7-1.8 #mu# thickness, sputtered onto single crystal leucosapphire and fused quartz substrates.
机译:采用较早开发的用于三层系统(导电探针-介电薄膜-介电体衬底)的交流热剥法来确定Ba_1-xSr_xTiO_3系统中的比热C_p和导热系数#lambda#的异常在铁电相变中。观察到C_p的异常,并分析了厚度为1.7-1.8#mu#的膜的x = 0.2; 0.5; 0.8,该膜被溅射到单晶隐色蓝宝石和熔融石英衬底上。

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