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Structure-property relationships of Au films electrodeposited on Ni

机译:电沉积在镍上的金膜的结构-性质关系

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Thin gold films and coatings on metal have long constituted an important technology for the microelectronics industry and will continue to be important for microdevices such as contact springs. The properties of these materials may be highly processing dependent, particularly when the gold is deposited by electrochemical means. In this study, we characterize gold electrodeposited on Ni substrates from two bath chemistries: hard Au sulfite with proprietary hardening additive and soft Au cyanide. TEM and SEM show that the bath chemistry alters the microstructure and the resulting surface of the electrodeposits. Nanoindentation techniques were used to determine the elastic and plastic properties of the Au electrodeposits as a function of the specifics of processing. Soft Au electrodeposits have a grain size of on the order of 300 nm and a hardness of about 1 GPa. Hard Au electrodeposits produced from the sulfite bath feature grain sizes as small as 30 nm, some twinning, and fine porosity uniformly distributed both within the grains and at grain boundaries. The hardness is about 2 GPa, approaching the hardest values reported for sputtered gold films. The effect of the hardening agent on the microstructure of electrodeposits from the Au sulfite bath was also investigated and found to significantly refine the grain size at concentrations of at least 4 mL/L, although little additional refinement was found at higher concentrations.
机译:薄薄的金膜和金属上的涂层长期以来一直是微电子工业的一项重要技术,并将继续对诸如接触弹簧之类的微器件起重要作用。这些材料的性能可能在很大程度上取决于处理,特别是在通过电化学方法沉积金时。在这项研究中,我们通过两种镀液化学方法对电沉积在镍基底上的金进行了表征:具有专有硬化添加剂的硬亚硫酸金和氰化软金。 TEM和SEM显示,镀液化学性质改变了电沉积的微观结构和表面。纳米压痕技术被用来确定Au电沉积物的弹性和塑性特性,该弹性和塑性特性是加工工艺的函数。柔软的Au电沉积层的晶粒尺寸约为300 nm,硬度约为1 GPa。由亚硫酸盐浴产生的硬金电沉积物的特征是,粒径小至30 nm,有一些孪晶,并且细孔均匀地分布在晶粒内和晶界。硬度约为2 GPa,接近溅射金膜报道的最硬值。还研究了硬化剂对亚硫酸金浴中电沉积物微观结构的影响,发现在至少4 mL / L的浓度下可以显着细化晶粒尺寸,尽管在更高的浓度下几乎没有其他细化作用。

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