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Optimal microelectromechanical systems (MEMS) device for achieving high pyroelectric response of AlN

机译:用于实现AlN高热电响应的最佳微机电系统(MEMS)装置

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This paper discusses research being conducted on aluminum nitride (AlN) as a pyroelectric material for use in detecting applications. AlN is being investigated because of its high pyroelectric coefficient, thermal stability, and high Curie temperature. In order to determine suitability of the pyroelectric properties of AlN for use as a detector, testing of several devices was conducted. These devices were fabricated using microelectromechanical systems (MEMS) fabrication processes; the devices were also designed to allow for voltage and current measurements. The deposited AlN films used were 150 nm - 300 nm in thickness. Thin-films were used to rapidly increase the temperature response after the thermal stimulus was applied to the pyroelectric material. This is important because the pyroelectric effect is directly proportional to the rate of temperature change. The design used was a face-electrode bridge that provides thermal isolation which minimizes heat loss to the substrate, thereby increasing operation frequency of the pyroelectric device. A thermal stimulus was applied to the pyroelectric material and the response was measured across the electrodes. A thermal imaging camera was used to monitor the changes in temperature. Throughout the testing process, the annealing temperatures, type of layers, and thicknesses were also varied. These changes resulted in improved MEMS designs, which were fabricated to obtain an optimal design configuration for achieving a high pyroelectric response. A pyroelectric voltage response of 38.9 mV_(p-p) was measured without filtering, 12.45 mV_(p-p) was measured in the infrared (IR) region using a Si filter, and 6.38 mV_(p-p) was measured in the short wavelength IR region using a long pass filter. The results showed that AlN's pyroelectric properties can be used in detecting applications.
机译:本文讨论了有关氮化铝(AlN)作为热电材料用于检测应用的研究。由于AlN具有高的热电系数,热稳定性和居里温度,因此正在研究中。为了确定适合用作检测器的AlN热电性能的适用性,对几种设备进行了测试。这些器件是使用微机电系统(MEMS)的制造工艺制造的;该设备还设计用于电压和电流测量。所使用的沉积的AlN膜的厚度为150nm至300nm。在对热电材料施加热刺激之后,使用薄膜来快速增加温度响应。这一点很重要,因为热电效应与温度变化率成正比。所使用的设计是一个面电极桥,该桥电极提供了热隔离,从而最大限度地减少了向基板的热损失,从而提高了热释电器件的工作频率。对热释电材料施加热刺激,并在电极上测量响应。使用热像仪监视温度变化。在整个测试过程中,退火温度,层的类型和厚度也有所变化。这些变化导致了改进的MEMS设计,这些设计被制造出来以获得用于实现高热释电响应的最佳设计配置。未经过滤测得的热电电压响应为38.9 mV_(pp),使用Si滤光片在红外(IR)区域测得的热电电压响应为12.45 mV_(pp),而使用Si滤光片在短波长IR区域测得的热电电压响应为6.38 mV_(pp)。长通滤波器。结果表明,AlN的热电性质可用于检测应用。

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