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High Productivity DRIE solutions for 3D-SiP and MEMS volume manufacturing

机译:适用于3D-SiP和MEMS批量生产的高效DRIE解决方案

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摘要

Emerging 3D-SiP technologies and high volume MEMS applications require high productivity mass production DRIE systems. A study based on sub-micron high aspect ratio structures encountered in the most stringent 3D-SiP has been carried out. The optimization of the Bosch process parameters have shown high silicon etch rate, with good uniformity and repeatability leading to good process yields. In parallel, most recent hardware and proprietary design optimization including vacuum pumping lines, process chamber, wafer chucks, pressure control system, gas delivery are discussed.rnThese improvements have been monitored in a mass production environment for a mobile phone application. Field data analysis shows a significant reduction of cost of ownership thanks to increased throughput and much lower running costs. These benefits are now available for all 3D-SiP and high volume MEMS applications. The typical etched patterns include tapered trenches for CMOS imagers, through silicon via holes for die stacking, well controlled profile angle for 3D high precision inertial sensors, and large exposed area features for inkjet printer head and Silicon microphones.
机译:新兴的3D-SiP技术和大批量MEMS应用要求高生产率的大规模生产DRIE系统。已经基于最严格的3D-SiP中遇到的亚微米高纵横比结构进行了研究。博世工艺参数的优化显示出较高的硅刻蚀速率,具有良好的均匀性和可重复性,从而可实现良好的工艺良率。同时,讨论了最新的硬件和专有设计优化,包括真空泵送线,工艺室,晶片卡盘,压力控制系统,气体输送。这些改进已在大规模生产环境中进行了监控,以用于手机应用。现场数据分析表明,由于吞吐量提高了,运行成本大大降低,因此拥有成本大大降低了。这些优势现在可用于所有3D-SiP和大批量MEMS应用。典型的蚀刻图案包括用于CMOS成像器的锥形沟槽,用于芯片堆叠的硅通孔,用于3D高精度惯性传感器的受控制轮廓角以及用于喷墨打印机头和硅麦克风的大暴露区域特征。

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