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Cold Source Engineering towards Sub-60mV/dec p-Type Field-effect-transistors (pFETs): Materials, Structures, and Doping Optimizations

机译:冷源工程朝向子60mV / DEC P型现场效应 - 晶体管(PFET):材料,结构和掺杂优化

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To break the thermal limit of 60mV/dec sub-threshold swing, this work presents a comprehensive study on the strategy for designing p-type cold source FET (pCS-FET). By using first-principles simulations and quantum-transport modeling method, the source engineering of density of states that governs the CS-FET performance is investigated in terms of CS materials, heterojunction structures, and doping process. It is shown that sub-60mV/decade switching can be realized with various CS materials, including 2D metal materials, Dirac material (graphene) and n-doped semiconductors (Si, MoS2). Especially, an excellent SS of ~24 mV/dec over four decades of current can be achieved with n-doped graphene CS. More importantly, a steep slope as low as ~33mV/dec also can be achieved with a simply stacked n-doped Si as the CS.
机译:为了打破60mV / DEC次阈值挥杆的热限制,这项工作提出了关于设计P型冷源FET(PCS-FET)的策略进行了综合研究。通过使用第一原理模拟和量子传输建模方法,根据CS材料,异质结结构和掺杂工艺来研究治理CS-FET性能的状态密度的源工程。结果表明,可以用各种CS材料实现亚60mV /十个切换,包括2D金属材料,狄拉越材料(石墨烯)和N掺杂半导体(Si,MOS 2 )。特别是,通过N掺杂的石墨烯Cs可以实现42mV / Dec的优异SS。更重要的是,通过简单地堆叠的N掺杂Si作为CS,也可以实现低至33mV / Dec的陡坡。

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