In the past, it has been difficult to perform test generation for complex RF subsystems due to the cost of repeated system level simulation necessary for running a test generation algorithm. In this paper, a new test generation method for RF sub-systems driven by behavioral models is presented. The test generator produces an optimized multi-tone test stimulus (alternate test) from which the subsystem test specifications can be simultaneously computed. The test generation algorithm attempts to maximize the accuracy with which all the system test specifications can be determined from knowledge of the different ways in which perturbations of the behavioral model parameters affect the test specifications. Pass/fail test decisions are made using the specification values computed from the observed test response (single test). Simulation results using the proposed test approach show accurate tracking of multiple system specifications, such as gain and IIP3 for the receive channel of an RF transceiver, with an error within ± 1 dB.
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