Fully-integrated 40-Gb/s pulse pattern generator and bit-error-rate tester chipsets in 65-nm CMOS technology

摘要

Fully-integrated 40-Gb/s pulse pattern generator (PPG) and bit-error-rate tester (BERT) chipsets has been presented in 65-nm CMOS technology. Using external clock inputs, the PPG and BERT achieve full operation with ultra-wide data range from 40 Mb/s to 40 Gb/s. Built-in PLL and CDR circuits are also included to provide robustness for standard specification testing.