Zeroes of amplitude of 's' and 'p' componentsof linearly polarized light at the reflectionfrom a system 'thin dielectric Elm - absorbing basis'

摘要

The polarization properties of dielectric films on an absorbing substrate in a neighbourhood of bifurcation points are investigated. It is shown that polarimetric and ellipsometric measurements of optic-geometric parameters of film structures are most sensitive in the areas of a bifurcation.