首页> 外文会议>International Conference on Optics and Electro-Optics >Optical Surface Profiling Using Beamlet Deflection Method
【24h】

Optical Surface Profiling Using Beamlet Deflection Method

机译:使用束偏转方法进行光学表面分析

获取原文

摘要

Deflectometry and slope measurement techniques are being used for surface profiling and wavefront estimation. In present study a screen having multiple apertures of small size is inserted in the object path which is illuminated by a collimated and test wave. The beamlets are generated and its images at different image planes are used to compute the wavefront slope. These slopes are then used in reconstruction of the wavefront. The preliminary results of the investigations carried out on beamlet deflection technique to estimate the spherical, cylindrical and freeform wavefronts are presented. At longer image plane distances, the calculation of slope value is more accurate and hence the wavefront estimation.
机译:偏转测量和斜率测量技术用于表面分析和波前估计。 在本研究中,在通过准直和测试波照射的物体路径中插入具有多个小尺寸孔的屏幕。 在不同图像平面处产生辐射并在不同图像平面上进行图像来计算波前斜率。 然后将这些斜面用于重建波前。 提出了对深色偏转技术进行的研究的初步结果,以估计球形,圆柱形和自由形波线。 在较长的图像平面距离处,斜率值的计算更准确,因此是波前估计。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号