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Enhancement-Mode Buried Strained Silicon Channel Double Quantum Dot with Integrated Electrometer

机译:增强模式埋地应变硅通道双量子点,具有集成电计

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Silicon and silicon-germanium heterostructure devices are interesting test beds for exploring solid-state quantum computing. Electron spin lifetimes and coherence times in fully relaxed SiGe / strained Si (sSi) quantum well devices are much longer than competing systems (e.g. gallium- arsenide heterostructures), with further improvements expected. Additionally, highly crystalline and high mobility interfaces allow fabrication of few electron dots and sensitive electrometers more easily. We propose and demonstrate a relaxed-SiGe/sSi enhancement-mode gate stack for quantum dots. The wafers are grown to our specification using CVD process by Lawrence SQI. The devices were fabricated within a 150 mm Si foundry setting that uses implanted ohmics and chemical-vapor-deposited dielectrics. Polysilicon depletion gates are used to form few electron dots in the sSi quantum well. High density plasma silicon dioxide was used as a secondary dielectric, followed by a tungsten/titanium nitride enhancement gate to draw electrons into the system. A modified implant, polycrystalline silicon formation and annealing conditions were utilized to minimize the thermal budget that potentially leads to Ge/Si interdiffusion. A mobility of 1.6E5 cm^2/Vs at 5.8E11 /cm^2 is measured in Hall bars that witness the same device process flow as the quantum dot. Periodic Coulomb blockade conductance oscillations are measured in a single quantum dot nanostructure, evidence of discrete electron number. The Coulomb blockade diamonds increase to at least ±10 mV of dc voltage across the device after the last transition, a strong indication of single electron dot occupation. Charge transitions in a double quantum dot system are observed using the integrated electrometer, with tunable coupling between the dots. This work was performed, in part, at the Center for Integrated Nanotechnologies, a U.S. DOE, Office of Basic Energy Sciences user facility. The work was supported by the Sandia National Laborato- ies Directed Research and Development Program. Sandia National Laboratories is a multi- program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000. References [1] A. M. Tyryshkin, S. A. Lyon, W. Jantsch, & F. Schaffler, "Spin manipulation of free two- dimensional electrons in Si/SiGe quantum wells," Phys. Rev. Lett., vol 94, pp. 126802, 2005. [2] T. M. Lu, N. C. Bishop, T. Pluym, J. Means, P. G. Kotula, J. Cederberg, L. A. Tracy, J. Dominguez, M. P. Lilly, and M. S. Carroll, "Enhancement-mode buried strained silicon channel quantum dot with tunable lateral geometry," Appl. Phys. Lett., vol. 99, no. 4, pp. 043101, 2011.
机译:硅和硅锗异质结构装置是有趣的试验台,用于探索固态量子计算。电子自旋寿命和完全放松的SiGe /应变Si(SSI)量子阱器件的相干时间比竞争系统(例如镓 - 砷化物异质结构)更长,预期进一步改善。另外,高晶体和高迁移率界面允许更容易地制造几个电子点和敏感电电动机。我们提出并展示了用于量子点的宽松SiGe / SSI增强模式门堆。通过劳伦斯SQI使用CVD进程的晶片成长为我们的规范。这些器件在150mm Si铸造厂中制造,该铸造厂采用植入欧姆和化学 - 蒸汽沉积的电介质。多晶硅耗尽栅极用于在SSI量子阱中形成少量电子点。使用高密度等离子体二氧化硅作为二级电介质,然后用​​钨/氮化钛增强栅极将电子吸入系统中。利用改性植入物,多晶硅形成和退火条件来最小化可能导致GE / Si间隔的热预算。在5.8E11 / cm ^ 2处的移动性为5.8e11 / cm ^ 2 / vs的霍尔条测量,该霍尔条在作为量子点作为量子点目睹相同的设备过程流动。定期Coulomb封锁电导振荡在单量子点纳米结构中测量,证据是离散电子数。在最后一个过渡后,库仑阻断钻石在整个设备上增加到整个设备上的至少±10 mV的直流电压,是单电子点占用的强烈指示。使用集成电磁管观察双量子点系统中的电荷转换,点之间的可调耦合。这项工作部分地部分地在集成纳米技术中心,美国DOE,基本能源科学用户设施办公室。这项工作得到了桑迪亚国家实验室的支持研究和发展计划。 Sandia National Laboratories是由Sandia Corporation(Lockheed Martin Corporation)的全资子公司为美国能源部核安保期部门的多项项目实验室管理和运营的多项计划实验室,该公司在合同DE-AC04-9-94AL85000下进行了美国能源部的国家核安全管理部门。参考文献[1] A. M. Tyryshkin,S.A.Lyon,W. Jantsch,&F. Schaffler," Si / SiGe量子井的自由二维电子的旋转操纵,"物理。 Rev. Lett。,Vol 94,PP。126802,2005. [2] TM Lu,NC主教,T.Pluym,J.手段,PG Kotula,J. Cederberg,La Tracy,J. Dominguez,MP Lilly和MS carroll,"增强模式埋地应变硅通道量子点,可调横向几何,"苹果。物理。 Lett。,Vol。 99,没有。 4,pp。043101,2011。

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