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Noise in MgB2 thin film: a candidate material for space-borne infrared detector development

机译:MGB2薄膜中的噪音:空间红外探测器开发的候选材料

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An MgB2 thin film was grown on a SiN-Si substrate, with a superconducting transition temperature, Tc, near 39K. At the mid-point of the transition (T= 38.24K) and at 10Hz a noise spectral density SV = 0.34nV/ √Hz was measured. The temperature noise, Kn, of the MgB2 film at different frequencies is compared to that of cuprate high temperature superconducting (HTS) thin films (with Tc ~ 90 K) used currently in transition-edge bolometers. Κn values predict that high performance far-IR thermal detectors (i.e bolometers) can be developed using MgB2 as a thermistor.
机译:在SIN-Si衬底上生长MGB2薄膜,具有超导转变温度,TC,接近39K。 在过渡(T = 38.24k)的中点(T = 38.24K)和10Hz的处于噪声光谱密度SV = 0.34NV /√Hz。 将MGB2膜的温度噪声噪声与不同频率的噪声噪声进行比较,与当前在过渡边缘钻孔器中使用的铜酸盐高温超导(HTS)薄膜(具有Tc〜90k)的薄膜。 κN值预测,可以使用MGB2作为热敏电阻来开发高性能远IR热检测器(I.E钻头)。

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