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Low-Temperature Bonding Method Based On Metallic Microcone Array For Interconnection Application

机译:基于金属微通阵互连应用的低温键合方法

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Stacked bonding has become one of the key technologies of 3D IC. This paper reports a low-temperature solid state bonding method based on metallic microcone array for potential use in 3D integration applications. Sn-3.0Ag-0.5Cu solder balls with 760 μm diameter were used for the lowtemperature BGA bonding. Ni micro cone layer was prepared by electro deposition and Cu micro cone layer was deposited by electroless plating, respectively. Bonding joints were shear tested to evaluate the joint strength of samples bonded at each pressure and temperature. Microscopic observation showed sufficient insertion between Sn and cone-structured Ni or Cu. Results showed that bonding strength was superior with proper bonding conditions.
机译:堆叠粘接已成为3D IC的关键技术之一。 本文报道了一种基于金属微酮阵列的低温固态键合方法,用于3D集成应用中的潜在应用。 SN-3.0AG-0.5CU直径为760μm-0.5CU焊球用于低温BGA键合。 通过电沉积制备Ni微锥层,通过电镀沉积Cu微锥层。 粘合接头被剪切测试,以评估在每个压力和温度下键合的样品的关节强度。 显微镜观察显示Sn和锥形Ni或Cu之间的充分插入。 结果表明,粘合强度优异,具有适当的粘合条件。

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