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Flow Behavior Analysis of Emc in Molded Underfill (Muf) Encapsulation for Multi Flip-Chip Package

机译:模塑底填充(MUF)封装MEMC的流动性能分析,用于多倒装芯片封装

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This paper present a numerical analysis of molded underfill (MUF) for multi flip chip package during encapsulation. Castro Macosko model is used in ANSYS fluent to describe the flow behavior of the EMC. The physical quantities such as viscosity, shear rate and velocity is plotted to analyzed the flow behavior of EMC during encapsulation. The EMC flow behavior at flip chip (FC) and free passage (FP) region in cavity are been compared. The viscosity profile of EMC is inversely proportional to the shear rate and velocity profile at FC and FP region The tendency of "frozen skin" layer occur in cavity package have been predicted with velocity profile during encapsulation.
机译:本文在封装期间,对多倒装芯片封装进行了模制底填充(MUF)的数值分析。 Castro MacOSKO模型用于SNSYS流畅,以描述EMC的流动行为。绘制了诸如粘度,剪切速率和速度的物理量,以分析封装期间EMC的流动性能。比较倒装芯片(Fc)和空腔中的自由通道(FP)区域的EMC流动行为。 EMC的粘度曲线与Fc的剪切速率和速度分布成反比,FP区域的速度曲线在腔封装期间已经预测了腔封装中的“冷冻皮肤”层的趋势。

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