首页> 外文会议>International Conference on Applied Physics of Condensed Matter >Thin Films against Multilayers of a-Si:H: Comparative Study on Optical Properties
【24h】

Thin Films against Multilayers of a-Si:H: Comparative Study on Optical Properties

机译:对A-Si的多层的薄膜:H:光学性质的比较研究

获取原文

摘要

This paper presents studies on structure and optical properties of a-Si:H thin films and multilayers of a-Si:H prepared at two different hydrogen dilutions. For all samples detected as amorphous with low micro structure factor UV Vis transmittance spectra were used to extract refractive indices, absorption coefficients and optical band gap energies. Refractive indices decrease with the thin film/multilayer thickness what means materials of lower density. On the contrary optical band gaps determined via the Tauc procedure were found to be blue-shifted with increasing both the film and multilayer thickness what is beneficial for solar applications.
机译:本文介绍了A-Si:H薄膜和A-Si:H在两种不同氢稀释液中制备的薄膜和多层的结构和光学性质的研究。对于用低微观结构因子UV检测为无定形的所有样品,用于提取折射率,吸收系数和光带间隙能量。折射率随薄膜/多层厚度而减小,其中密度较低的材料。在通过TaUC过程确定的相反光带间隙上,发现蓝色移位,随着薄膜和多层厚度的增加,对于太阳能应用是有益的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号