首页> 外文会议>Balkan Physical Union., International Conference >Мeasurement Of The Mass Attenuation Coefficient From 81 kev to 1333 kev For Elemental Materials Al, Cu And Pb
【24h】

Мeasurement Of The Mass Attenuation Coefficient From 81 kev to 1333 kev For Elemental Materials Al, Cu And Pb

机译:从81 keV到1333 keV的质量衰减系数为元素材料Al,Cu和Pb

获取原文

摘要

The mass attenuation coefficients (μ/ρ) for 3 high purity elemental materials Al, Cu and Pb were measured in the γ-ray energy range from 81 keV up to 1333 keV using ~(22)Na, ~(60)Co ~(133)Ba and ~(133)Cs as sources of gamma radiation. Well shielded detector (NaI (Tl) semiconductor detector) was used to measure the intensity of the transmitted beam. The measurements were made under condition of good geometry, assuring that any photon absorbed or deflected appreciably does not reach the detector. The measured values are compared with the theoretical ones obtained by Seltzer (1993).
机译:在使用〜(22)Na,〜(60)Co〜(4)的γ射线能量范围内测量3个高纯度元素材料Al,Cu和Pb的质量衰减系数(μ/ρ),〜(60)CO〜( 133)BA和〜(133)CS作为伽马辐射的来源。屏蔽屏蔽镜(NAI(TL)半导体检测器)用于测量透射光束的强度。在良好的几何形状的条件下进行测量,确保任何光子吸收或偏转的光子并未到达探测器。将测量值与由Seltzer(1993)获得的理论值进行比较。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号