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The effect of mole-fraction on power spectral density of single quantum well based InxGa1-xN/GaN blue light emitting diode

机译:摩尔分数对单量子阱基INXGA1-XN / GaN蓝光发光二极管功率谱密度的影响

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A single quantum well Light Emitting Diode (LED) is designed from two different semiconductors and the main advantages of quantum well structure are high radiative efficiency, surface recombination etc. We have designed the device in order to observe the impact of mole fraction on power spectral density at different wave length by keeping the anode voltage fixed. A nearly lattice matched AlGaN-InGaN-GaN double hetero-structure semiconductor device has been simulated to get the maximum power spectral density at a particular wave length. For the anode voltage of 5V, at a mole fraction of x= 0.24 for Indium in InxGa1-xN, it is observed that a power spectral density of 9.31 W/cm-eV is obtained at a wave length of 452 nm. Observations were made for mole fraction varying from x=0.01 to 0.30.
机译:单量子阱发光二极管(LED)由两个不同的半导体设计,量子阱结构的主要优点是高辐射效率,表面重组等。我们设计了该装置,以便观察摩尔分数对功率谱的影响通过保持阳极电压固定在不同波长的密度。已经模拟了近晶格匹配的Algan-Ingan-GaN双异质结构半导体器件以获得特定波长的最大功率谱密度。对于5V的阳极电压,在INXGA1-XN中的铟的X = 0.24的摩尔分数下,观察到在452nm的波长中获得9.31W / cm-EV的功率谱密度。对于从X = 0.01至0.30的摩尔分数进行观察。

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