Novel CMOS analog signal processing technique for solid-state X-ray sensors

摘要

A new technique for analog signal processing of X-ray generated signal is proposed. The technique leads to higher maximum photon count rates that will enable SPECT cameras to increase X-ray doses closer to the levels achieved by computer tomography (CT) while retaining excellent low noise properties of the system due to single event nature of the SPECT detection. The proposed technique has been implemented in 0.18 mum CMOS process. The proposed shaper connects seamlessly to our new peak detector structure reported elsewhere.