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Light emission from Si avalanche mode LEDs as a function of E field control, impurity scattering, and carrier density balancing

机译:Si Avalanche模式LED的发光作为E现场控制,杂质散射和载波密度平衡的函数

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Light emission in silicon LEDs that operate in the avalanche mode of operation, was analyzed by appropriate modelling, including the silicon energy band structure, available carrier energy spread, and available carrier momentum spread. These mechanisms play key roles in the realization of light emitting, using standard silicon processing procedures. The analyses indicate that appropriate doping and controlling the energized specifically electrons, carrier energy and carrier density by field manipulation, and controlling carrier momentum through appropriate impurity scattering technology, show great potential to enhance these emissions. Particularly, development work conducted on the p+np+ mono-silicon LED and the N+PN+PN+ Poly silicon LED show that field control, impurity and defect scattering and balancing the carrier type and carrier density has a profound influence on the optical emission intensity in Si AMLEDs. Furthermore, a much clearer understanding of the mechanisms responsible for optical emissions in Si Av LEDs has been obtained and can proceed with further improved device designs and applications.
机译:在于,在操作的雪崩模式下操作硅的LED,光发射是通过适当的建模,包括硅的能带结构,可用载波的能量传播,可用载波动量扩散分析。这些机制在实现发光的起关键作用,使用标准的硅处理过程。的分析表明,合适的掺杂和控制的电子,载波能量和载流子密度由字段操纵具体通电,并控制通过适当的杂质散射技术载体势头,表现出极大的潜力,以增强这些排放。特别是,开发工作在p + NP +单晶硅LED以及N + P N + P N +多晶硅LED显示,场控制,杂质和缺陷散射和平衡载流子类型和载流子密度对光学发射强度产生深远的影响进行在硅AMLEDs。此外,已经获得负责的Si平均的LED光辐射的机制的一个更清楚的理解,并且可以具有进一步改进的设备的设计和应用进行。

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