Structural, morphological, and optical studies of Rutile-phase TiO_2 rods grown on F:SnO_2-coated glass substrate by hydrothermal chemical bath deposition

摘要

Structural, morphological and optical studies of rutile-phase TiO_2 rods, grown on F:SnO_2-coated glass substrates, using hydrothermal chemical bath deposition, are reported. The methods used to determine the optical properties of a semiconductor-on-substrate two-medium system have been successfully applied to the following three-medium structure: vertically well-aligned rods of TiO_2, an F:SnO_2 (FTO) conducting thin film and a glass substrate. Reflectance fringe measurements yielded the thickness of the TiO_2 layer to be d = 4.2 μm, which agreed well with the length of rods observed using SEM. The F:SnO_2 thickness of 569 nm measured from reflectance fringe spacings also agreed with SEM measurements. A room temperature absorption edge of E_g = 2.90 eV was obtained for the top layer of TiO_2 rods, which is similar to other values reported for TiO_2. A room temperature absorption edge of E_g = 3.56 eV was determined for the conducting F:SnO_2 layer.