Dielectric Properties of γ-Iirradiated, Stretched, and Poled PVDF Thin Films

摘要

The effects of γ-irradiation on the dielectric properties of stretched and poled polyvinylidene fluoride thin films synthesized by solvent cast method are reported. The films are subjected to γ-irradiation with different doses (25, 50, and 75 kGy). XRD pattern is obtained to identify the presence of α/β phases. Dielectric constant and loss values of the stretched and poled films have been measured, before and after irradiation, and their nature of variation has been studied. β phase is retained even after the irradiation thereby confirming that the radiation damage is not significant. The dielectric loss is minimum in the frequency range 10~2 to10~4 Hz, giving the preferable frequency range of operation for devices