Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission

机译：欧罗巴剪裁者的总电离剂量（TID）的总电离剂量概要

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This paper reports recent total ionizing dose (TID) test results post 300 kRad(Si) for a variety of common part types evaluated for use on NASA/JPL's Europa Clipper mission.

机译：本文报告了最近的总电离剂量（TID）测试结果Post 300 Krad（Si），用于各种用于NASA / JPL的Europa Clipper Mission的各种共同部分类型。

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《IEEE Nuclear amp;amp;amp; Space Radiation Effects Conference》|2018年|366 p. :|共11页
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Amanda N. Bozovich; Bernard G. Rax; Joe Davila; Duc Nguyen; Aaron J. Kenna; Stephanie A. Zajac; Steven S. McClure; Jason L. Thomas; Leif Z. Scheick; Kelly W. Stanford; Patrick Gevargiz; Mitch J. Sundgaard;
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中图分类 O432.1-532;
关键词
Performance evaluation; Testing; Degradation; BiCMOS integrated circuits; Propulsion; Total ionizing dose;

机译：性能评估;测试;降解;BICMOS集成电路;推进;全电离剂量;

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1. Accumulative total ionizing dose (TID) and transient dose rate (TDR) effects on planar and vertical ferroelectric tunneling-field-effect-transistors (TFET) [J] . Yan Gangping, Xu Gaobo, Bi Jinshun, Microelectronics & Reliability . 2020,第Nova期

机译：累积总电离剂量（TID）和瞬态剂量率（TDR）对平面和垂直铁电隧道场效应 - 晶体管（TFET）的影响
2. Total Ionizing Dose (TID) Effects in GaAs MOSFETs With La-Based Epitaxial Gate Dielectrics [J] . Shufeng Ren, Maruf A. Bhuiyan, Jingyun Zhang, Nuclear Science, IEEE Transactions on . 2017,第1期

机译：具有基于La的外延栅极电介质的GaAs MOSFET中的总电离剂量（TID）效应
3. Total Ionizing Dose (TID) Effects in Ultra-Thin Body Ge-on-Insulator (GOI) Junctionless CMOSFETs With Recessed Source/Drain and Channel [J] . Shufeng Ren, Maruf A. Bhuiyan, Heng Wu, Nuclear Science, IEEE Transactions on . 2017,第1期

机译：源极/漏极和沟道凹陷的超薄体绝缘体上绝缘子（GOI）无结CMOSFET中的总电离剂量（TID）效应
4. Updated Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission [C] . Stephanie A. Zajac, Amanda N. Bozovich, Bernard G. Rax, IEEE Radiation Effects Data Workshop;IEEE Nuclear and Space Radiation Effects Conference . 2020

机译：更新了Europa Clipper Mission的全电离剂量（TID）测试结果的汇编
5. Total Ionizing Dose and Dose Rate Effects on (Positive and Negative) BJT Based Bandgap References [D] . Davis, Parker 2019

机译：总电离剂量和剂量率对（正负）BJT带隙基准的影响
6. Total ionizing dose (TID) effects of γ ray radiation on switching behaviors of Ag/AlOx/Pt RRAM device [O] . Fang Yuan, Zhigang Zhang, Jer-Chyi Wang, 2014

机译：γ射线总电离剂量（TID）对Ag / AlO转换行为的影响X/ Pt RRAM设备
7. Monte Carlo Evaluation of the Europa Clipper TID Margin Based on the Variability of the Jovian Radiation Environment With Application for Mission Design [O] . A. Andersen, W. Kim, S. McClure, 2020

机译：基于Jovian辐射环境的可变性，蒙特卡罗评价欧罗巴剪裁者TID边坡，采用特派团设计的应用
8. Evaluation of High Performance Converters Under Low Dose Rate Total Ionizing Dose (TID) Testing for NASA Programs [R] . Sharma, Ashok K., Sahu, Kusum 1998

机译：在Nasa计划的低剂量率总电离剂量（TID）测试下评估高性能转换器

Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission

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