Preparation and Complex Study of Thick Films Based on Nanostructured Cu_(0.1)Ni_(0.8)Co_(0.2)Mn_(1.9)O_4 and Cu_(0.8)Ni_(0.1)Co_(0.2)Mn_(1.9)O_4 Ceramics

摘要

The problem stabilization of exploitation parameters in functional elements for sensor electronics is of outstanding importance [1, 2]. Often, solid-state media with a highly compact structure are characterized by the ability to resist the influence of various external factors, including higher temperatures, their gradient and time differences, aggressive atmospheric impurities, electromagnetic fields, etc.