Time-Resolved Nanostructural Analysis of Thin-Film Formation Process from Nafion Solution by Synchrotron X-ray Scattering

摘要

The dynamics of thin-film formation process from Nafion solution induced by solvent evaporation were investigated by in-situ time-resolved grazing-incidence small- and wide-angle X-ray scattering (GISAXS/GIWAXS) measurements utilizing synchrotron radiation. GISAXS/GIWAXS measurements revealed subnano- to nano-scaled structural development during thin-film formation process from Nafion solution. In the early stage, solvent evaporation decreased the distance between the scatter structures in Nafion solution. With the solvent evaporation, the ordered structures with a spacing of 3.3 nm appeared and finally solidified. In-situ time-resolved GISAXS/GIWAXS techniques provide a powerful tool to investigate the development of structures during thin-film formation process from polymer solutions including ionomer solution.