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Theoretical approach to surface plasmon scattering microscopy for single nanoparticle detection in near infrared region

机译:近红外区域近纳米粒子检测表面等离子体散射显微镜的理论方法

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We present a theoretical approach to single nanoparticle detection using surface plasmon scattering microscopy. Through rigorous coupled wave analysis assuming light incidence on a gold coated BK7 glass substrate under total internal reflection condition for a 200-nm polystyrene as targets attached to the gold film, it was found that surface plasmon polariton induced by incident light on the gold thin film is perturbed. As a result, parabolic waves were observed in the reflection plane. By varying angles of incidence and wavelengths, optimum incident conditions for surface plasmon scattering microscopy were obtained.
机译:我们使用表面等离子体散射显微镜呈现单纳米粒子检测的理论方法。通过严格的耦合波分析,假设在全内反射条件下的金涂覆的BK7玻璃基板上的光入射是200nm聚苯乙烯的总内反射条件下作为连接到金膜的靶标,发现通过在金薄膜上引起的入射光诱导的表面等离子体偏振片是扰动的。结果,在反射平面中观察到抛物线波。通过不同的入射角和波长角度,获得了表面等离子体散射显微镜的最佳入射条件。

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