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The Thermographic Measuring of the Surface Temperature of The Peripheral Wall after Removing a Technical Device for Elimination of Reflected Radiation

机译:除去技术装置之后,外围壁的表面温度的热成像测量,用于消除反射辐射

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It is possible to measure the surface temperature of a peripheral wall in a certain point with an advantage when using a technical device for elimination of reflected radiation. Other advantages of the diagnostics of the peripheral wall using the infrared termographic system after removing the mentioned technical device from the wall is, that if we determine (using the technical device) the surface temperature in a determined point, then we are, after inserting it into the termographic system, able to determine retroactively the real value of the apparent reflected temperature, and this is even done with higher accuracy. Then we use the value for a termographic measuring of all the surface of the peripheral wall, keeping the same angle of scanning.
机译:当使用用于消除反射辐射的技术装置时,可以在某个点中测量周边壁的表面温度。在从墙壁移除上述技术装置之后,使用红外关系系统的外围壁的诊断的其他优点是,如果我们在插入时确定(使用技术设备)表面温度,那么我们就是在插入后进入关键系统,能够追溯地确定表观反射温度的实际值,甚至以更高的精度完成。然后我们使用用于外围壁的所有表面的关键测量值,保持相同的扫描角度。

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