On-line Detection Method of Quality Defects in Manufacturing Process based on Wavelet Finite Element

摘要

In this paper, researchers use a wavelet-based solution to enhance the adaptive finite element method flaw inherent frequency beam, and study to conclude a particular state and the intrinsic link between the modal parameters, and establish a precise qualitative and quantitative identification based on the establishment of internal defects lifting wavelet adaptive format FEM model, accurate identification of internal defects in the category, location, size and other qualitative and quantitative. Defecting detection technology will be applied to the adaptive wavelet lifting scheme based on the finite element method quality manufacturing process and have achieved good experimental results.