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Low Temperature Lanthanum Strontium Ferrite Thin Film Stress and Oxygen Surface Exchange Coefficient Measurements

机译:低温镧系锶铁氧体薄膜应力和氧表面交换系数测量

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Mechano-chemical coupling of La_(0.6)Sr_(0.4)FeO_(3-δ) thin films were observed below 500°C for the first time using a curvature relaxation technique. Chemical oxygen surface exchange coefficients (k's) were measured by fitting the transient curvature of the thin film|substrate bilayer specimens under controlled temperature and oxygen partial pressure. Reproducible k values and their activation energies were obtained and are consistent with bulk sample k's extrapolated from the literature.
机译:使用曲率松弛技术首次观察到La_(0.6)Sr_(0.4)FeO_(0.4)FeO_(3-Δ)薄膜的化学偶联。通过在受控温度和氧分压下拟合薄膜双层样本的瞬态曲率来测量化学氧表面交换系数(K's)。获得可重复的k值及其活化能量,并与来自文献外推的体样样品K一致。

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