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Oxygen surface exchange kinetics measurement by simultaneous optical transmission relaxation and impedance spectroscopy: Sr(TiFe)O3-x thin film case study

机译:通过同时光学透射弛豫和阻抗谱测量氧表面交换动力学:Sr(TiFe)O3-x薄膜案例研究

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摘要

We compare approaches to measure oxygen surface exchange kinetics, by simultaneous optical transmission relaxation (OTR) and AC-impedance spectroscopy (AC-IS), on the same mixed conducting SrTi0.65Fe0.35O3-x film. Surface exchange coefficients were evaluated as a function of oxygen activity in the film, controlled by gas partial pressure and/or DC bias applied across the ionically conducting yttria-stabilized zirconia substrate. Changes in measured light transmission through the film over time (relaxations) resulted from optical absorption changes in the film corresponding to changes in its oxygen and oxidized Fe (~Fe4+) concentrations; such relaxation profiles were successfully described by the equation for surface exchange-limited kinetics appropriate for the film geometry. The kchem values obtained by OTR were significantly lower than the AC-IS derived kchem values and kq values multiplied by the thermodynamic factor (bulk or thin film), suggesting a possible enhancement in k by the metal current collectors (Pt, Au). Long-term degradation in kchem and kq values obtained by AC-IS was also attributed to deterioration of the porous Pt current collector, while no significant degradation was observed in the optically derived kchem values. The results suggest that, while the current collector might influence measurements by AC-IS, the OTR method offers a continuous, in situ, and contact-free method to measure oxygen exchange kinetics at the native surfaces of thin films.
机译:我们比较了在同一混合导电SrTi0.65Fe0.35O3-x薄膜上通过同时的光学透射弛豫(OTR)和交流阻抗谱(AC-IS)测量氧气表面交换动力学的方法。评估表面交换系数与膜中氧气活性的关系,该变化受气体分压和/或施加在离子导电氧化钇稳定的氧化锆衬底上的直流偏压控制。随着时间的变化,穿过薄膜的光透射率的变化(松弛)是由于薄膜中的光吸收变化所致,该变化对应于薄膜中氧气和氧化铁(〜Fe 4 + )浓度的变化;通过适用于薄膜几何形状的表面交换受限动力学方程式成功描述了这种弛豫曲线。通过OTR获得的kchem值显着低于AC-IS得出的kchem值和kq值乘以热力学因子(散装或薄膜),表明金属集电器(Pt,Au)可能会提高k。通过AC-IS获得的kchem和kq值的长期下降也归因于多孔Pt集电器的劣化,而在光学衍生的kchem值中未观察到明显的下降。结果表明,尽管集电器可能会影响AC-IS的测量,但OTR方法提供了一种连续的,原位无接触的方法来测量薄膜自然表面上的氧交换动力学。

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