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Sputtered nickel oxide films for NO_2 gas sensors

机译:用于NO_2气体传感器的溅射氧化镍膜

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In recent years, lot of efforts was made to develop many types of nitrogen oxide gas sensors. Among them, most interesting are WO_3, V_2O_5, TiO_2, SnO_2 and NiO thin films as gas sensing layers. Relatively small effort has been done to examine nickel oxide. But reasonably good electrical properties and stability in air make it feasible for the fabrication of nickel oxide thin film based gas sensors. Hence, in the present study NiO thin films were deposited by dc reactive magnetron sputtering technique from a nickel metal target in argon and oxygen mixed atmosphere and studied its gas sensing properties towards NO_2 gas. The effect of process parameters on the structural, morphological and electrical properties of NiO was studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and Hall effect studies respectively. The films prepared at optimum conditions showed superior electrical properties and exhibited fine and uniform grains with RMS roughness 9.4 nm. These films were tested for gas sensing characteristics of NO_2 gas. The sensitivity of NiO thin film was investigated in the temperature range of 373 to 573 K. The dynamic response for the NiO films was observed at an operating temperature of 473 K, with gas concentration of 50 ppm for NO_2 gas.
机译:近年来,努力开发了许多类型的氮氧化物气体传感器。其中,最有趣的是WO_3,V_2O_5,TIO_2,SNO_2和NIO薄膜作为气体传感层。已经进行了相对较小的努力来检查氧化镍。但是,空气中的相当良好的电性能和稳定性使得制造镍氧化薄膜基气体传感器是可行的。因此,在本研究中,通过DC反应磁控溅射技术从氩气和氧气混合气氛中的镍金属靶沉积NiO薄膜,并研究其朝向NO_2气体的气体感测性能。通过X射线衍射(XRD),扫描电子显微镜(SEM),原子力显微镜(AFM)和霍尔效应研究,研究了工艺参数对NiO结构,形态学和电性能的影响。在最佳条件下制备的薄膜显示出优异的电性能,并具有9.4nm的RMS粗糙度的精细和均匀的晶粒。测试这些薄膜的NO_2气体的气体传感特性。在373至573k的温度范围内研究了NiO薄膜的敏感性。在473k的工作温度下观察到NiO膜的动态响应,气体浓度为NO_2气体为50ppm。

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