首页> 外文会议>Conference on active and passive signatures IV >Dependence of Detection Limits on Angular Alignment, Substrate Type and Surface Concentration in Active Mode Standoff IR
【24h】

Dependence of Detection Limits on Angular Alignment, Substrate Type and Surface Concentration in Active Mode Standoff IR

机译:检测限对有源模式梯级IR中角度对准,基板型和表面浓度的依赖性

获取原文

摘要

A standoff multivariate calibration for detection of highly energetic materials (HEM) using Fourier transform infrared spectroscopy is presented in this report. The procedure consists in standoff sensing at 1 m distance and the variation of three parameters of detection. The first variable considered was the angular dependence: 0° to 45° from source-target with respect to alignment of target-detector. The second variable consisted on the use of several surfaces on which the material was deposited. The substrates used were polished aluminum and anodized aluminum. The third variable studied was the dependence on some specific analyte loading surface concentration: from 10 μg/cm~2 to200 μg/cm~2. The HEM used in this work was PETN, synthesized in our lab. Calibration curves were based on the use of chemometrics routines such as partial least squares (PLS) regression analysis. This algorithm was used to evaluate the impact of the angular dependence about the limits of detection of different HME loadings on aluminum substrates.
机译:本报告中提出了一种使用傅里叶变换红外光谱检测高度充电能材料(下摆)的支架多元校准。该程序在距离距离和检测参数的三个参数的变化下进行梯级感测。考虑的第一变量是角度依赖性:从源极针对目标检测器的对准,从源极靶向0°到45°。第二种变量包括在使用沉积材料的几种表面上。使用的基材是抛光铝和阳极氧化铝的。研究的第三种变量是对一些特异性分析物负荷表面浓度的依赖性:10μg/ cm〜2至200μg/ cm〜2。在这项工作中使用的下摆是佩特,在我们的实验室中合成。校准曲线是基于使用化学计量器的使用,例如局部最小二乘(PLS)回归分析。该算法用于评估角度依赖性对铝基衬底上不同HME载荷的限制的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号