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STUDY OF EPOXY FLUX TO IMPROVE RELIABILITY OF IC PACKAGES FOR AUTOMOTIVE APPLICATIONS

机译:环氧磁通量提高汽车应用IC包装可靠性的研究

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Over recent years, the volume of electronic components in cars has increased at an incredible rate. With the trend toward increased functionality, greater speed and higher integration, the components used in electric vehicles and autonomous driving are simultaneously increasing in size and decreasing in pitch. As a result of these design trends, there is an increasing amount of heat generated within the semiconductor packages and this is contributing to the challenge of ever-increasing reliability specifications. Compared to mobile devices, tablets, laptops and many other applications, automotive components and assemblies have severe temperature cycling requirements. For example, the AEC-Q10 Grade 1 temperature cycling test range is -40°C to 125°C. It is generally known that the upper/package side of the solder joint is susceptible to cracking and failure during this regimen. One approach to addressing this challenge is by increasing the bulk strength of the solder by using high-reliability solder alloy to improve joint strength. Another is to mechanically reinforce the solder joint with polymer-based compounds such as underfill (UF), sidefill (SF) and cornerbond (CB) materials. However, these methods increase the burden on the assembler by adding additional equipment, processes and materials. As an alternative method for improving temperature cycling reliability, the researchers developed a material capable of perform solder ball reinforcement and ball attachment simultaneously in one reflow using epoxy flux for solder ball mounting on a semiconductor package. This evaluation was performed on a 0.3 mm pitch wafer level package (WLP) with SAC305 solder balls. First, solder ball mounting performance was evaluated comparing two epoxy flux formulations to a conventional equipment manufacturer's recommend flux. The second epoxy flux (EF2) performed as well as the standard flux. A simulation analysis was performed modeling the effects of four reinforcement structures. Parts were assembled and subjected to -40°C to 125°C temperature cycling regimen. The results confirmed the simulation analysis that reinforcement of the upper/package-side solder joint increased the reliability performance by approximately three-fold.
机译:近年来,汽车中的电子元件量以令人难以置信的速度增加。随着功能性增加的趋势,更高的速度和更高的集成,电动车辆和自主驱动中使用的部件同时增加尺寸和降低的间距。由于这些设计趋势,在半导体封装中产生了越来越多的热量,这有助于不断增加的可靠性规格的挑战。与移动设备,平板电脑,笔记本电脑和许多其他应用相比,汽车部件和组件具有严重的温度循环要求。例如,AEC-Q10级温度循环试验范围为-40°C至125°C。通常已知在该方案期间,焊点的上/封装侧易于破裂和失败。解决这一挑战的一种方法是通过使用高可靠性焊料合金来提高焊料的体积强度以提高关节强度。另一种是用基于聚合物的化合物,例如底部填充(UF),嵌入式(SF)和拐角(CB)材料来机械地加强焊点。但是,这些方法通过添加额外的设备,工艺和材料来增加装配器的负担。作为提高温度循环可靠性的替代方法,研究人员使用用于在半导体封装上的焊球安装在一个回流中,在一个回流中同时开发一种能够在一个回流中同时进行焊球加强和球连接。使用SAC305焊球对0.3mm间距晶片水平封装(WLP)进行该评估。首先,评估焊球安装性能与传统设备制造商推荐助焊剂的两种环氧助焊剂配方进行比较。第二环氧助焊剂(EF2)表达以及标准通量。进行了仿真分析,建模了四种增强结构的影响。组装零件并经受-40℃至125℃的温度循环方案。结果证实了仿真分析,上/包装侧焊点的加固增加了大约三倍的可靠性性能。

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