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Long-range Interaction between H and (B, P, As, Sb) Dopant Atoms in Silicon Crystals Investigated by First Principles Calculation

机译:通过第一原理计算研究H和(B,P,AS,Sb)之间的掺杂剂原子之间的远程相互作用

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The energy gain in Si crystal systems as a function of the distance between a hydrogen (H) atom and a boron (B), a phosphorus (P). an arsenic (As), an antimony (Sb) dopant atom was investigated using first principles calculation. The giving and taking by the exchange of an electron between a H atom and a dopant atom was found to respectively result in a gain of about 0.98 eV (B). 0.67 eV (P), 0.66 eV (As), 0.74 eV (Sb), even when the atoms were fully separated and had no direct interactions. An ionized H atom in B-doped Si crystals always was found to exist at the bond-center site whether it was located near a B atom or not. H atoms in n-type Si crystals were found to be stable at tetrahedral sites except in the vicinity of a donor atom. In this vicinity, H atoms prefer to go into an anti-bonding site.
机译:Si晶体系统中的能量增益作为氢气(H)原子和硼(B),磷(P)之间的距离的函数。使用第一原理计算研究了砷(AS),锑(Sb)掺杂剂原子。通过在H原子和掺杂剂原子之间交换电子的给药和采取的赋予和服用分别导致约0.98eV(b)的增益。 0.67eV(P),0.66eV(AS),0.74eV(SB),即使原子完全分离,也没有直接相互作用。无论是否位于B原子附近,都会发现B掺杂Si晶体中的离子化H原子存在于粘合中心部位。在N型Si晶体中发现H原子在四面体位点处稳定,除了在供体原子附近。在该附近,H原子宁可进入抗粘合部位。

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