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Long-range Interaction between H and (B, P, As, Sb) Dopant Atoms in Silicon Crystals Investigated by First Principles Calculation

机译:通过第一原理计算研究硅中H和(B,P,As,Sb)掺杂原子之间的远程相互作用

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摘要

The energy gain in Si crystal systems as a function of the distance between a hydrogen (H) atom and a boron (B), a phosphorus (P), an arsenic (As), an antimony (Sb) dopant atom was investigated using first principles calculation. The giving and taking by the exchange of an electron between a H atom and a dopant atom was found to respectively result in a gain of about 0.98 eV (B), 0.67 eV (P), 0.66 eV (As), 0.74 eV (Sb), even when the atoms were fully separated and had no direct interactions. An ionized H atom in B-doped Si crystals always was found to exist at the bond-center site whether it was located near a B atom or not. H atoms in n-type Si crystals were found to be stable at tetrahedral sites except in the vicinity of a donor atom. In this vicinity, H atoms prefer to go into an anti-bonding site.
机译:首先使用以下方法研究了Si晶体系统中的能量增益随氢(H)原子与硼(B),磷(P),砷(As)和锑(Sb)掺杂原子之间的距离的变化关系。原理计算。发现通过在H原子和掺杂原子之间交换电子进行给予和吸收,分别获得约0.98 eV(B),0.67 eV(P),0.66 eV(As),0.74 eV(Sb ),即使原子完全分离且没有直接相互作用。总是发现在B掺杂的Si晶体中离子化的H原子是否存在于键中心部位,无论它是否位于B原子附近。发现n型Si晶体中的H原子在四面体位点稳定,除了施主原子附近。在这个附近,H原子更喜欢进入反键位。

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  • 来源
    《High purity silicon 12》|2012年|105-113|共9页
  • 会议地点 Honolulu HI(US)
  • 作者

    E. Kamiyama; K. Sueoka;

  • 作者单位

    Department of Communication Engineering, Okayama Prefectural University, 111 Kuboki, Soja, Okayama 719-1197, Japan;

    Department of Communication Engineering, Okayama Prefectural University, 111 Kuboki, Soja, Okayama 719-1197, Japan;

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  • 正文语种 eng
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