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TGO Growth on Bond Coats with and without Y Addition

机译:TGA在邦德涂层上的增长,没有Y添加

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In order to assess the effect of Y addition on TGO growth, oxidation behavior of MCrAl(M=Ni and/or Co) bond coats with and without 0.5mass.% Y were examined under isothermal condition at 950 to 1100 °C for up to 2000h. The TGO thckness and phase constitution were investigated by means of SEM and EDX, then it was found that TGO formed on Y-free MCrAl bond coats showed slower growth kinetiks than that of fomred on conventional MCrAlY bond coats. The TGO formed on conventional MCrAlY bond coats were composed Al_2O_3 with small amount of Y-rich oxide inclusions. By contrast, Y-free MCrAl coatings formed exclusive Al_2O_3 as the TGO. This result indicates that potential improvements to the bond coat oxidation behaviour can be achieved using Y-free bond coat compositions.
机译:为了评估Y添加对TGO生长的影响,MCRAL(M = Ni和/或共/ /或共同)粘合涂层的氧化行为,其中没有0.5mass。在950至1100℃下在等温条件下检查%Y. 2000小时。通过SEM和EDX研究了TGO Thckness和相位构成,然后发现在Y自由键涂层上形成的TGO显示比常规McRaly键涂层上的较慢的生长kinetik。在常规McRaly键涂层上形成的TGO与少量富氧化物夹杂物组成Al_2O_3。相比之下,Y自由的MCRAL涂层作为TGO形成了独家Al_2O_3。该结果表明,可以使用无键粘合涂层组合物实现对粘合涂层氧化行为的潜在改进。

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