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Effect of substrate bias voltage on the mechanical and tribological properties of low concentration Ti-containing diamond like carbon films

机译:基板偏压对含低浓度Ti金刚石等碳膜的机械和摩擦学性质的影响

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Ti containing hydrogenated diamond like carbon films (Ti-DLC) was deposited on Si substrates at room temperature by magnetron sputtering Ti-twin target in methane and argon mixture atmosphere via changing the substrate bias voltage. The Ti atomic concentration in the film is less than 0.57% and exists mainly in the form of metallic titanium rather than TiC, confirmed by XPS analysis. The internal compressive stress of the film decreases monotonically with the substrate bias voltage increase. However, the hardness values of the film keep at level (12 GPa) without almost any obvious change with the increase of the substrate bias voltage. Furthermore, Ti-containing DLC film prepared at -1600 V substrate bias voltage shows an extremely low wear rate (~10~(-9) mm~3/Nm) and low friction coefficient (0.09).
机译:通过磁控溅射Ti-Twin靶在甲烷和氩气混合气氛中通过改变基板偏置电压,在室温下在室温下沉积含有氢化金刚石(Ti-DLC)的Ti在Si底物上沉积在Si底物上。薄膜中的Ti原子浓度小于0.57%,主要以金属钛的形式而不是TIC,通过XPS分析证实。膜的内部压缩应力随着基板偏置电压的增加而单调地减小。然而,膜的硬度值保持在级别(12GPa),随着基板偏置电压的增加而几乎具有几乎任何明显变化。此外,在-1600V衬底偏置电压下制备的含Ti的DLC膜显示出极低的磨损率(〜10〜(-9)mm〜3 / nm)和低摩擦系数(0.09)。

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