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Influence of Nd doping on the structural and near-IR photoluminescence properties of nanostructured TiO2 films

机译:Nd掺杂对纳米结构TiO2薄膜结构和接近红外光致发光性能的影响

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摘要

Doping of TiO2-a wide band gap material-with Neodyrriium (Nd ) ions have been the focus of research interest for the solar spectrum downshifting, a process which can improve the efficiency of silicon based solar cells. This work presents the influence of varying Nd doping concentration in the range 1.17-25 at.% in the TiO2 host matrix. Thin films of thickness between 1-2um were deposited by Radio-Frequency Co-Sputtering of TiO2 and Neodymium (Nd) target on quartz and silicon substrates at room temperature. The films are annealed in an air ambient after deposition. Film properties were studied from the structural and chemical composition point of view by means of X-ray diffraction (XRD), Auger Electron Spectroscopy (AES). Two distinct photoluminescence emission peaks were observed at 902 and 1080 nm in the doped films, pertaining to the transitions between the excited levels ~4F_(3/2) to ~4I_(9/2) and ~4I_(11/2) levels of the Nd~(3+) ions by exciting at 514.5 and 355 nm.
机译:掺杂TiO2-A宽带隙材料 - 与NeodyRiium(ND)离子一直是太阳能光谱下卓的研究兴趣的重点,该过程可以提高基于硅的太阳能电池效率的过程。该作品呈现在1.17-25范围内的不同Nd掺杂浓度的影响。%在TiO2宿主基质中。通过在室温下通过TiO 2和钕(Nd)靶的射频共溅射沉积1-2um之间的薄膜沉积在1-2um之间。沉积后,薄膜在空气环境中退火。通过X射线衍射(XRD),螺旋电子光谱(AES)从结构和化学成分的观点中研究了膜性能。在掺杂的薄膜中在902和1080nm下观察到两个不同的光致发光发射峰,与激发水平〜4f_(3/2)至〜4i_(9/2)和〜4i_(11/2)水平之间的过渡有关的通过在514.5和355nm处令人兴奋的Nd〜(3+)离子。

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