首页> 外文会议>International Conference on Mechanical Materials and Manufacturing Engineering >Preparation of Pb(Zr_(0.52)Ti_(0.48))O_3-Ni_(0.5)Zn_(0.5)Fe_2O_4 Bilayer Thin Films and Their Magnetic and Ferroelectric Properties
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Preparation of Pb(Zr_(0.52)Ti_(0.48))O_3-Ni_(0.5)Zn_(0.5)Fe_2O_4 Bilayer Thin Films and Their Magnetic and Ferroelectric Properties

机译:Pb的制备(Zr_(0.52)Ti_(0.48))O_3-Ni_(0.5)Zn_(0.5)Fe_2O_4双层薄膜及其磁性和铁电性能

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Ni_(0.5)Zn_(0.5)Fe_2O_4-Pb(Zr_(0.52)Ti_(0.48))O_3 (NZFO-PZT) composite films were prepared using sol-gel method on Si (100) substrate with different bilayer structures, namely, the NZFO/PZT (NP) and the PZT/NZFO (PN). Their structure, magnetic and ferroelectric properties were characterized by X-ray diffractometer (XRD), vibration sample magnetometer (VSM) and ferroelectric testing unit. Both the NP and the PN films exhibit coexistence of magnetic and ferroelectric properties. The overlapping sequence has much influence on the electrical properties. Whereas, such an overlapping structure of the films has slightly effect on its magnetic properties. The NP structured composite film is more suitable to get a promising magnetoelectric coupling.
机译:使用不同双层结构的Si(100)衬底上使用溶胶 - 凝胶法制备Ni_(0.5)Zn_(0.5)Fe_2O_4-PB(Zr_(0.52)Ti_(0.48))O_3(NZFO-PZT)复合膜。 NZFO / PZT(NP)和PZT / NZFO(PN)。其结构,磁性和铁电性能以X射线衍射仪(XRD),振动样品仪(VSM)和铁电试验单元为特征。 NP和PN膜两者都表现出磁性和铁电性能的共存。重叠序列对电性能有很大影响。然而,薄膜的这种重叠结构对其磁性有点效果。 NP结构复合膜更适合于获得有前途的磁电耦合。

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