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Reliability of ACA Interconnections on Microvia HDI PCBs in thermal cycling conditions

机译:热循环条件下Microvia HDI PCBS对互联网的可靠性

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New packaging technologies require new high density substrates. In built up high density interconnect (HDI) printed circuit boards (PCB) high density is achieved by using built up microvia layers. Such HDI PCBs may be used in many applications. In flip chip technology a bare chip is attached directly to a substrate which enables very high density and requires often also HDI PCBs. Anisotropic conductive adhesives (ACA) are especially well suited interconnection materials for high density flip chip applications. In this study the reliability of flip chip ACA attachments on several different HDI PCBs was studied. The PCBs had similar core layers, but the microvia layers of the PCBs were different. Test chips were attached on these PCBs using an ACA film (ACF). The reliability of the interconnections was tested using fast thermal cycling between the temperatures of -40°C and 125°C. Several failures were seen with all PCB materials during the 2,000 cycles of testing. The differences in the reliability of the different microvia layers were found to be relatively small and the microvia layer composition did not seem to be critical for the thermal cycling reliability of the ACF interconnections.
机译:新的包装技术需要新的高密度基材。在建立的高密度互连(HDI)印刷电路板(PCB)通过建立的Microvia层实现高密度。这种HDI PCB可以在许多应用中使用。在倒装芯片技术中,裸芯片直接连接到基板,该基板可实现非常高的密度,并且通常也需要HDI PCB。各向异性导电粘合剂(ACA)特别适用于高密度倒装芯片应用的互连材料。在这项研究中,研究了倒装芯片ACA附件对几种不同HDI PCB的可靠性。 PCB具有相似的核心层,但PCB的Microvia层不同。使用ACA薄膜(ACF)将测试芯片连接在这些PCB上。使用-40°C和125℃的温度之间的快速热循环测试互连的可靠性。在2,000个测试期间,在所有PCB材料中看到了几种故障。发现不同微径层可靠性的差异是相对较小的,微孔层组合物似乎对ACF互连的热循环可靠性并不重要。

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