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High-NA EUV projection lens with central obscuration

机译:高NA EUV投影镜头,具有中央遮挡

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摘要

EUV projection lens consisting of four coaxial mirrors with a Numerical Aperture of 0.485 and a twelve-fold demagnification has been developed. According to the computation the circuit features at 10 nm in center and 20 nm on the edge of 12.4 mm field of view can be imaged. The scheme of the projection lens with such demagnification promotes the production of the defect-less masks and reduction of their cost.
机译:已经开发出由具有0.485的数值孔径和12倍脱磁的四个同轴镜组成的EUV投影透镜。根据计算,可以成像,电路在12.4mm视场的边缘中的10nm处的电路特征和20nm。投影镜片的方案具有这种脱磁率促进了缺陷掩模的生产和降低成本。

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