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Analysis of Transient faults on a MlPS-based Dual-Core Processor

机译:基于MLP的双核处理器瞬态断层分析

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This paper presents a simulation-based fault injection analysis of a MIPS-based dual-core processor. In order to fulfill the requirement of this analysis, 114 different fault targets are used in various points of main components which are described in VHDL language; each experiment was repeated 50 times, resulting in 5700 transient faults in this simulation model. The experimental results demonstrate that, depending on the fault injection targets and the benchmark characteristics, fault effects vary significantly. On average, up to 35.2% of injected faults are recovered in simulation time, while 52.6% of faults lead to system failure, and the remaining 12.2%, treat as latent errors. Different benchmarks show different vulnerability for various components; but on average, Arbiter and Message passing interface are the most vulnerable components outside the tiles, while PC and Bus Handler have highest failure rate among in-tile components. Fault injection on each region has noticeable impact on the result of the other core. In general, fault injection in Shared regions has highest contribution in system failure.
机译:本文介绍了基于MIPS的双核处理器的基于模拟的故障注射分析。为了满足该分析的要求,在VHDL语言中描述的主要组件的各个点中使用114个不同的故障目标;每个实验重复50次,导致该模拟模型中的5700个瞬态断层。实验结果表明,根据故障注射目标和基准特性,故障效应显着变化。平均而言,在模拟时间内恢复高达35.2%的注射断层,而52.6%的故障导致系统故障,剩下的12.2%,视为潜在的错误。不同的基准显示各种组件的不同漏洞;但平均而言,仲裁器和消息传递界面是图块外部最脆弱的组件,而PC和总线处理程序在块内部组件之间具有最高的故障率。每个区域的故障注射对另一个核心的结果产生显着的影响。通常,共享区域中的故障注入在系统故障中具有最高贡献。

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