首页> 外文会议>ECS Meeting/PRiME >A Novel Process For Etching Modulated Profiles
【24h】

A Novel Process For Etching Modulated Profiles

机译:用于蚀刻调制型材的新方法

获取原文
获取外文期刊封面目录资料

摘要

A novel process for spot repair of damaged anodized aluminum panels is described. The process is based on etching the aluminum oxide layer using special fixtures that provide controlled, gradual transitions of the etched profile, enabling the fabrication of "borderline"-free repaired regions. The process does not require the application of etching masks. The profile of the etched region is solely controlled by the geometry of the specially developed etching fixture. Excellent agreement has been noted between experimental results and transport controlled models that predict the etching profile.
机译:描述了损坏阳极氧化铝板的点修复新方法。该方法基于使用提供蚀刻轮廓的控制,逐渐过渡的特殊夹具蚀刻氧化铝层,从而能够制造“边界” - 免费修复区域。该过程不需要应用蚀刻掩模。蚀刻区域的轮廓仅由专门开发的蚀刻夹具的几何形状控制。在预测蚀刻轮廓的实验结果和运输控制模型之间已经注意到了很好的协议。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号