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A qualitative comparison study of analog performance of junction and junctionless poly-Si TFTs

机译:结和无连接多Si TFT的模拟性能的定性比较研究

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In this work, a qualitative comparison study of analog performance of junction and junctionless poly-Si TFTs is carefully investigated. According to numerical simulations, we find out that both gm and gD of junction poly-Si TFT are higher than the junctionless poly-Si TFT at a fixed IDS. Based on the same S/D doping concentration the junctionless poly-Si TFT can have a better short-channel behavior than its counterpart. Thus, it can be proved that a junctionless poly-Si TFT is a good option for AMLCD and AMOLED Applications.
机译:在这项工作中,仔细研究了结和无连接多SiTFT的模拟性能的定性比较研究。根据数值模拟,结合Poly-Si TFT的G M 和G D 高于固定I DS 。基于相同的S / D掺杂浓度,结的连接多Si TFT可以具有比其对应物更好的短通道行为。因此,可以证明无连接多Si TFT是AMLCD和AMOLED应用的良好选择。

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